We present a novel method for device noise measurement, based on a two-channel cross-correlation technique and a direct “in situ” measurement of the transimpedance of the device under test (DUT), which allows improved accuracy with respect to what is available in the literature, in particular when the DUT is a nonlinear device. Detailed analytical expressions for the total residual noise are derived, and an experimental investigation of the increased accuracy provided by the method is performed.
Improvement of the accuracy of noise measurements by the two-amplifier correlation method
PELLEGRINI, BRUNO;BASSO, GIOVANNI;FIORI, GIANLUCA;MACUCCI, MASSIMO;MARCONCINI, PAOLO
2013-01-01
Abstract
We present a novel method for device noise measurement, based on a two-channel cross-correlation technique and a direct “in situ” measurement of the transimpedance of the device under test (DUT), which allows improved accuracy with respect to what is available in the literature, in particular when the DUT is a nonlinear device. Detailed analytical expressions for the total residual noise are derived, and an experimental investigation of the increased accuracy provided by the method is performed.File in questo prodotto:
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